报告题目

XAFS for investigating the mechanism of catalytic reaction

报告人

Dr. Daiki Kido

报告人单位

Institute of Materials Structure Science (IMSS), High Energy Accelerator Research Organization(KEK), Japan

报告时间

2025年7月16日（星期三）15:00

报告地点

近代物理楼509会议室

主办单位

精准智能化学全国重点实验室

报告摘要

XAFS (X-ray Absorption Fine Structure) is one of the powerful tools to obtain information on the electronic state and the local geometrical structure around the X-ray absorbing atoms. XAFS can be applied in-situ or operando measurement by utilizing the high transmittance of X-ray to the gases or solutions. In addition, XAFS can be applied to non-crystalline materials. Therefore, XAFS has various advantages for investigating the mechanism of catalytic reaction under the working condition. In this presentation, the fundamentals of XAFS and applications to the catalyst field are introduced. The X-ray absorption spectroscopy is explained from the basics to the measurement at the synchrotron radiation facility. In addition to the fundamental part, the examples of XAFS measurement in the catalyst field are introduced from the experience in Photon Factory at KEK.

报告人简介

Dr. Daiki Kido is currently an assistant professor at Institute of Materials Structure Science (IMSS), High Energy Accelerator Research Organization (KEK), Tsukuba, Japan. He received the PhD degree from Hokkaido University, Hokkaido, Japan in 2020 and then started the postoctoral research at Institute for Catalysis, Hokkaido University, cooperative with famous XAFS expert Prof. Kiyotaka Asakura during 2021-2023. His research area includes in situ and time-resolved investigations of model systems based on metal oxides for (photo)electrocatalysis. Since 2023, He works as the beamline scientist and is in charge of the operation of BL12C and NW10A XAFS beamline station in Photon Factory.